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Characteristics of InGaP∕InGaAs MOS-PHEMT with Liquid Phase–Oxidized GaAs Gate Dielectric
- Source :
- Journal of The Electrochemical Society. 158:H1225
- Publication Year :
- 2011
- Publisher :
- The Electrochemical Society, 2011.
- Subjects :
- Materials science
Renewable Energy, Sustainability and the Environment
business.industry
Gate dielectric
Electrical engineering
Liquid phase
High-electron-mobility transistor
Condensed Matter Physics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Materials Chemistry
Electrochemistry
Optoelectronics
business
Subjects
Details
- ISSN :
- 00134651
- Volume :
- 158
- Database :
- OpenAIRE
- Journal :
- Journal of The Electrochemical Society
- Accession number :
- edsair.doi...........5e2467924400b53d399a027617afcedb
- Full Text :
- https://doi.org/10.1149/2.048112jes