Electrothermal Effects on Hot Carrier Injection in n-Type SOI FinFET Under Circuit-Speed Bias

MLA

Jun Hu, et al. “Electrothermal Effects on Hot Carrier Injection in N-Type SOI FinFET Under Circuit-Speed Bias.” IEEE Transactions on Electron Devices, vol. 64, Sept. 2017, pp. 3802–07. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........5ff7fed24615993b6b61a428332fd1b1&authtype=sso&custid=ns315887.

APA

Jun Hu, Wen-Yan Yin, Peng Zhang, & Wenchao Chen. (2017). Electrothermal Effects on Hot Carrier Injection in n-Type SOI FinFET Under Circuit-Speed Bias. IEEE Transactions on Electron Devices, 64, 3802–3807.

Chicago

Jun Hu, Wen-Yan Yin, Peng Zhang, and Wenchao Chen. 2017. “Electrothermal Effects on Hot Carrier Injection in N-Type SOI FinFET Under Circuit-Speed Bias.” IEEE Transactions on Electron Devices 64 (September): 3802–7. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........5ff7fed24615993b6b61a428332fd1b1&authtype=sso&custid=ns315887.