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Research on high-quality patent evaluation methods based on machine learning
- Source :
- Third International Conference on Machine Learning and Computer Application (ICMLCA 2022).
- Publication Year :
- 2023
- Publisher :
- SPIE, 2023.
Details
- Database :
- OpenAIRE
- Journal :
- Third International Conference on Machine Learning and Computer Application (ICMLCA 2022)
- Accession number :
- edsair.doi...........603c7914611e2d3adabfdf0a03d0c8d7
- Full Text :
- https://doi.org/10.1117/12.2675169