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Etching materials with an atmospheric-pressure plasma jet

Authors :
Robert F. Hicks
J Y Jeong
Jaeyoung Park
V J Tu
Ivars Henins
G S Selwyn
Steve E. Babayan
Source :
Plasma Sources Science and Technology. 7:282-285
Publication Year :
1998
Publisher :
IOP Publishing, 1998.

Abstract

A plasma jet has been developed for etching materials at atmospheric pressure and between 100 and C. Gas mixtures containing helium, oxygen and carbon tetrafluoride were passed between an outer, grounded electrode and a centre electrode, which was driven by 13.56 MHz radio frequency power at 50 to 500 W. At a flow rate of , a stable, arc-free discharge was produced. This discharge extended out through a nozzle at the end of the electrodes, forming a plasma jet. Materials placed 0.5 cm downstream from the nozzle were etched at the following maximum rates: for Kapton ( and He only), for silicon dioxide, for tantalum and for tungsten. Optical emission spectroscopy was used to identify the electronically excited species inside the plasma and outside in the jet effluent.

Details

ISSN :
13616595 and 09630252
Volume :
7
Database :
OpenAIRE
Journal :
Plasma Sources Science and Technology
Accession number :
edsair.doi...........615882a111a6c4981dfe78643fec0a79
Full Text :
https://doi.org/10.1088/0963-0252/7/3/005