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Interpretation of Compressive Strain Causing Critical Current Degradation of Bi2212 Round Wires

Authors :
Yi-Feng Wang
Zhao-Fei Jiang
Zhao-Xia Zhang
Xiao-Fan Gou
Source :
IEEE Transactions on Applied Superconductivity. 32:1-8
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
23787074 and 10518223
Volume :
32
Database :
OpenAIRE
Journal :
IEEE Transactions on Applied Superconductivity
Accession number :
edsair.doi...........647d0eab62badcd2648b6a8c76721f29