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Modeling of Super Steep Subthreshold Slope Device by using Neural Network

Authors :
Kengo Nakata
Takayuki Mori
Jiro Ida
Source :
2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)
Accession number :
edsair.doi...........6561fb732a57aca685940bf81349a2fb
Full Text :
https://doi.org/10.1109/imfedk56875.2022.9975367