Comparison of optoelectronic properties of epitaxial and non-epitaxial GaN nanostructures

Structural, optical and surface properties of epitaxially grown 2D GaN nanowall network using Molecular Beam Epitaxy have been compared to those of non-epitaxially grown single-crystalline 1D GaN nanowires using Chemical Vapour Deposition. The kinetics of growth mechanisms and formed morphology are shown to significantly influence the respective band structures and consequently their luminescence properties. X-ray diffraction and Raman spectroscopy reveal that the epitaxial 2D nanowall network experiences a hydrostatic strain in addition to a compressive strain, whereas non-epitaxial 1D nanowires possess a morphology-dependent tensile/compressive strain and a negligible hydrostatic strain. Slightly blue-shifted photoluminescence emission from both these nanostructures is markedly enhanced compared to that from an epilayer. The epitaxial nanowall network exhibits the highest enhancement in the band edge emission among them. X-ray photoelectron spectroscopy spectra show shifts in the valence band features and in the hybridization of shallow core levels. Using the XRD, Raman, PL and XPS data, a variation in the band structure of these differently kinetically formed GaN nanostructures is also sketched.