Detection thresholds of structured noise in the presence of shot noise

An observer study was run to determine the detection thresholds of several representative examples of column fixed pattern noise, in the presence of varying levels of shot noise, which is known to mask structured noise. The data obtained were fit well at relevant shot noise levels by a simple model based on signal detection theory. Individual metrics of fixed pattern noise and shot noise, used in the masking equation, were computed from one dimensional integrations involving the capture noise power spectra (mapped to CIELAB space); the modulation transfer function of the display; the display pixel pitch; the viewing distance; and the S-CIELAB luminance contrast sensitivity function. The results of this work can be used to predict detection thresholds that can be added to photon transfer curves for the purpose of determining whether fixed pattern noise will be visible.