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Optical 2-D Fourier Transform Spectroscopy of Excitons in Semiconductor Nanostructures

Authors :
Xingcan Dai
Mark E. Siemens
Denis Karaiskaj
Steven T. Cundiff
Galan Moody
Hebin Li
Alan D. Bristow
Tianhao Zhang
Source :
IEEE Journal of Selected Topics in Quantum Electronics. 18:318-328
Publication Year :
2012
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2012.

Abstract

Optical 2-D Fourier transform spectroscopy is a powerful technique for studying resonant light-matter interactions, determining the transition structure and monitoring dynamics of optically created excitations. The ability to separate homogeneous and inhomogeneous broadening is one important capability. In this paper, we discuss the use of this technique to study excitonic transitions in semiconductor nanostructures. In quantum wells, the effects of structural disorder is observed as inhomogeneous broadening of the exciton resonances. In quantum dots, the temperature dependence of the homogeneous width gives insight into the nature of the dephasing processes.

Details

ISSN :
15584542 and 1077260X
Volume :
18
Database :
OpenAIRE
Journal :
IEEE Journal of Selected Topics in Quantum Electronics
Accession number :
edsair.doi...........68ee1299f20269bde76ecf42cd0a5283