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Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam
- Source :
- Microscopy and Microanalysis. 22:180-181
- Publication Year :
- 2016
- Publisher :
- Oxford University Press (OUP), 2016.
- Subjects :
- Analytical electron microscopy
Materials science
High resolution
02 engineering and technology
Electron beam-induced deposition
Atomic physics
010402 general chemistry
021001 nanoscience & nanotechnology
0210 nano-technology
01 natural sciences
Instrumentation
Focused ion beam
0104 chemical sciences
Subjects
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 22
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........6a08ce27623ea8a1a719192daa58cdd8
- Full Text :
- https://doi.org/10.1017/s1431927616001756