Back to Search Start Over

Forming-free resistive switching characteristics in manganese oxide and hafnium oxide devices

Authors :
Tae-Sik Yoon
Quanli Hu
Jaewan Kim
Tae Su Kang
Chi Jung Kang
Tae Sung Lee
Haider Abbas
Mi Ra Park
Nam Joo Lee
Source :
Japanese Journal of Applied Physics. 58:044001
Publication Year :
2019
Publisher :
IOP Publishing, 2019.

Details

ISSN :
13474065 and 00214922
Volume :
58
Database :
OpenAIRE
Journal :
Japanese Journal of Applied Physics
Accession number :
edsair.doi...........6b052a31c879e807fece32f4c4ddd088
Full Text :
https://doi.org/10.7567/1347-4065/ab01f8