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Pseudo-CCD-signal-based signal-to-noise test system for readout chain of TDICCD
- Source :
- Advanced Sensor Systems and Applications VIII.
- Publication Year :
- 2018
- Publisher :
- SPIE, 2018.
-
Abstract
- The readout chain circuits for time delay integration charge coupled device camera imaging system include CCD focal plane driving circuit, analog-to-digital conversion circuit, high-speed digital data transmission circuit and other parts together. The parasitic factors such as the quality of high frequency clock, high speed data transmission error rate and the aging of printed circuit board will induce more noise to image data of camera. As the longer time circuits working, the noise of readout chain becomes bigger and bigger, then the signal-to-noise becomes worse. This paper proposed a method to make circuit system check its noise as the circuit is working, which is based on pseudo CCD-signal to check the Signal-to-Noise of readout chain of TDICCD, and sends the result to control core of the system. The paper combines the theory calculation and actual measurement as the method for testing. High precision pseudo CCD signal source is used to test the onboard circuit and circuit SNR results of readout chain, harmonic frequency, noise floor and other related parameters are automatic processed.
- Subjects :
- Computer Science::Hardware Architecture
Printed circuit board
Computer Science::Emerging Technologies
Transmission (telecommunications)
Computer science
Noise (signal processing)
Astrophysics::Instrumentation and Methods for Astrophysics
Electronic engineering
Charge coupled device camera
Noise floor
Signal
Data transmission
Electronic circuit
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- Advanced Sensor Systems and Applications VIII
- Accession number :
- edsair.doi...........6b86ddcd2eab09f52711d853e70094ea