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New hardware for a streamlined cryo focused ion beam milling workflow

Authors :
Sebastian Tacke
Zhexin Wang
Stefan Raunser
Michael Grange
Source :
Microscopy and Microanalysis. 27:2082-2086
Publication Year :
2021
Publisher :
Oxford University Press (OUP), 2021.

Subjects

Subjects :
Workflow
Materials science
Mechanical engineering
Instrumentation
Focused ion beam

Details

ISSN :
14358115 and 14319276
Volume :
27
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........6c2909de12f1526a25847280462d45e9
Full Text :
https://doi.org/10.1017/s1431927621007522
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