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Enablement, Evaluation and Extension of a CDM ESD Verification Tool for IC Level

Authors :
Jens Schneider
Gernot Langguth
Lena Zeitlhofler
Patrick Huff
Yuri Feinberg
Christian Russ
Kai Esmark
Meruzhan Cadjan
Source :
2021 43rd Annual EOS/ESD Symposium (EOS/ESD).
Publication Year :
2021
Publisher :
IEEE, 2021.

Abstract

A complex IC design marginally passes CDM targets during qualification. Employing the verification tool ESRA initially reveals CDM-uncritical voltages. Detailed testing beyond the CDM target levels and an extended tool setup provide valuable findings: pin-specific CDM robustness, design improvements, and the need to treat particular on-chip conductors as inductive components during CDM.

Details

Database :
OpenAIRE
Journal :
2021 43rd Annual EOS/ESD Symposium (EOS/ESD)
Accession number :
edsair.doi...........6d56f04b798f10b32de538045963301e