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Enablement, Evaluation and Extension of a CDM ESD Verification Tool for IC Level
- Source :
- 2021 43rd Annual EOS/ESD Symposium (EOS/ESD).
- Publication Year :
- 2021
- Publisher :
- IEEE, 2021.
-
Abstract
- A complex IC design marginally passes CDM targets during qualification. Employing the verification tool ESRA initially reveals CDM-uncritical voltages. Detailed testing beyond the CDM target levels and an extended tool setup provide valuable findings: pin-specific CDM robustness, design improvements, and the need to treat particular on-chip conductors as inductive components during CDM.
Details
- Database :
- OpenAIRE
- Journal :
- 2021 43rd Annual EOS/ESD Symposium (EOS/ESD)
- Accession number :
- edsair.doi...........6d56f04b798f10b32de538045963301e