Diffraction Mapping with a Pixelated Detector to Quantify Crystal Orientation in 3D Structures Made from 2D Materials

Authors :: Joonki Suh
Zhen Chen
David A. Muller
Michael C. Cao
Chibeom Park
Elliot Padgett
Jiwoong Park
Source :: Microscopy and Microanalysis. 25:1956-1957
Publication Year :: 2019
Publisher :: Oxford University Press (OUP), 2019.

Subjects :: Diffraction
Materials science
Optics
business.industry
Detector
Crystal orientation
business
Instrumentation

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