Prototype Design of Wire Scanner for SHINE

Authors :: Wan, Jun
Chen, Fangzhou
Chen, Jie
Gao, Bo
Leng, Yongbin
Ye, Kairong
Yu, Luyang
Zhou, Weimin
Publication Year :: 2020
Publisher :: JACoW Publishing, Geneva, Switzerland, 2020.
Abstract: SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of SHINE in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in SHINE, and some simulation results are also shown and discussed.<br />Proceedings of the 9th International Beam Instrumentation Conference, IBIC2020, Santos, Brazil