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Prototype Design of Wire Scanner for SHINE
- Publication Year :
- 2020
- Publisher :
- JACoW Publishing, Geneva, Switzerland, 2020.
-
Abstract
- SHINE is a high repetition rate XFEL facility, based on an 8 GeV CW SCRF linac, under development in Shanghai. In order to meet the requirements of measuring the beam profile of SHINE in real time and without obstruction, a new diagnostic instrument, wire scanner has been designed. This paper mainly describes the design of wire scanner in SHINE, and some simulation results are also shown and discussed.<br />Proceedings of the 9th International Beam Instrumentation Conference, IBIC2020, Santos, Brazil
- Subjects :
- Transverse Profile and Emittance Monitors
Accelerator Physics
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.doi...........6db4d35290f05fbdb37fb831bffe1b31
- Full Text :
- https://doi.org/10.18429/jacow-ibic2020-thpp36