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150 GHz FMAX with high drain breakdown voltage immunity by multi gate oxide dual work-function (MGO-DWF)-MO SFET

Authors :
K. Kagimoto
K. Nagaoka
K. Adachi
M. Kamiyashiki
Y. Ito
Akira Hokazono
Kazunari Ishimaru
A. Hidaka
Masakazu Goto
Toshitaka Miyata
M. Kamimura
S. Hirooka
Shigeru Kawanaka
Yohji Watanabe
Tatsuya Ohguro
H. Tanaka
Source :
2015 IEEE International Electron Devices Meeting (IEDM).
Publication Year :
2015
Publisher :
IEEE, 2015.

Abstract

We propose Multi Gate Oxide — Dual Work-Function (MGO-DWF)-MOSFET which is suitable for low power AB-class RF power amplifier (RF PA). This was examined for the first time by comparing with a standard Cascode connection circuitry composed of LV- and HV- MOSFETs. Dramatically improved FMAX (150 GHz) with sufficient drain break-down voltage (VBD) was experimentally confirmed in a practical device structure. MGO-DWF-MOSFET has multiple roles in a unit device such as LV-MOSFET in source side regions and HV-MOSFET in drain side regions. This distinctive structure enables the reduction of the device area and a gate capacitance (CG) with a higher transconductance (Gm) and the suppression of drain conductance (GDS). Enhancement of FMAX, in other words, DC operation current reduction is achieved at a given operation point. This indicates that MGO-DWF MOSFET is advantageous for low power amplifier circuitry applications, typically for RF PA in internet of things (IoT) products.

Details

Database :
OpenAIRE
Journal :
2015 IEEE International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........6eda87870c63bf0550a6566fd6ccb036