Improving the Speed and Accuracy of Large-scale Scanning Transmission Electron Microscopy (STEM) Electron Scattering Simulations

Authors :: Robert Hovden
Reed Yalisove
Philipp M Pelz
Hamish G. Brown
Jonathan Schwartz
Jim Ciston
Colin Ophus
Luis Rangel DaCosta
Benjamin H. Savitzky
Source :: Microscopy and Microanalysis. 26:456-458
Publication Year :: 2020
Publisher :: Oxford University Press (OUP), 2020.

Subjects :: Optics
Materials science
Scale (ratio)
business.industry
Scanning transmission electron microscopy
business
Instrumentation
Electron scattering

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