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Characterizing and Modeling Nonvolatile Memory Systems

Authors :
Zixuan Wang
Jian Yang
Theodore Michailidis
Jishen Zhao
Xiao Liu
Steven Swanson
Source :
IEEE Micro. 41:63-70
Publication Year :
2021
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2021.

Abstract

Scalable server-grade nonvolatile RAM (NVRAM) DIMMs are commercially available with the release of Intel’s Optane DIMM. Recent studies on Optane DIMM-based systems unveil discrepant performance characteristics, compared with what many researchers thought before the product release. To thoroughly analyze the source of the discrepancy and facilitate real-NVRAM-aware system design, we develop an NVRAM microarchitecture characterization and modeling framework, consisting of a Low-level profilEr for Non-volatile memory Systems (LENS) and a Validated cycle-Accurate NVRAM Simulator (VANS). LENS allows users to comprehensively analyze NVRAM performance attributes and reverse engineer NVRAM microarchitectures. We use LENS to reverse engineer the sophisticated microarchitecture design of Optane DIMM and generate a set of architecture implications of industrial NVRAMs. VANS models Optane DIMM microarchitecture and is validated by comparing with the detailed performance characteristics of Optane DIMM-attached servers. VANS adopts a modular design that can be easily modified to extend to other NVRAM architecture designs.

Details

ISSN :
19374143 and 02721732
Volume :
41
Database :
OpenAIRE
Journal :
IEEE Micro
Accession number :
edsair.doi...........704cb236b9e8c0aa85a75acea7a9d770
Full Text :
https://doi.org/10.1109/mm.2021.3065305