Cite
The Crystalline Quality of Epitaxial Si Layers Solution Grown on Polycrystalline Si Substrates
MLA
B. Steiner, et al. “The Crystalline Quality of Epitaxial Si Layers Solution Grown on Polycrystalline Si Substrates.” MRS Proceedings, vol. 358, Jan. 1994. EBSCOhost, https://doi.org/10.1557/proc-358-889.
APA
B. Steiner, Martin Albrecht, Günter Wagner, A. Voigt, Th. Bergmann, Horst P. Strunk, & W. Dorsch. (1994). The Crystalline Quality of Epitaxial Si Layers Solution Grown on Polycrystalline Si Substrates. MRS Proceedings, 358. https://doi.org/10.1557/proc-358-889
Chicago
B. Steiner, Martin Albrecht, Günter Wagner, A. Voigt, Th. Bergmann, Horst P. Strunk, and W. Dorsch. 1994. “The Crystalline Quality of Epitaxial Si Layers Solution Grown on Polycrystalline Si Substrates.” MRS Proceedings 358 (January). doi:10.1557/proc-358-889.