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Test Method of Optoelectronic Parameters of CMOS Camera

Authors :
董岩 Dong Yan
李洪博 Li Hongbo
刘云清 Liu Yunqing
宋延嵩 Song Yansong
Source :
Laser & Optoelectronics Progress. 55:100401
Publication Year :
2018
Publisher :
Shanghai Institute of Optics and Fine Mechanics, 2018.

Subjects

Subjects :
CMOS sensor
business.industry
Computer science
Optoelectronics
Test method
Electrical and Electronic Engineering
business
Atomic and Molecular Physics, and Optics

Details

ISSN :
10064125
Volume :
55
Database :
OpenAIRE
Journal :
Laser & Optoelectronics Progress
Accession number :
edsair.doi...........7195b3ff78ab1615587f109ad7b2109c

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