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Advanced Materials Characterization with Full-Spectrum Phase Mapping

Authors :
T. Nylese
Robert Anderhalt
Source :
Microscopy Today. 22:18-23
Publication Year :
2014
Publisher :
Oxford University Press (OUP), 2014.

Subjects

Subjects :
Materials science
General Computer Science
business.industry
Optoelectronics
Phase mapping
Advanced materials
business
Characterization (materials science)

Details

ISSN :
21503583 and 15519295
Volume :
22
Database :
OpenAIRE
Journal :
Microscopy Today
Accession number :
edsair.doi...........7198feb61523262c78513ef32603b946
Full Text :
https://doi.org/10.1017/s1551929514000157
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