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Development of a placement exam to increase student success in a junior level circuits and systems class

Authors :
David W Parent
Source :
FIE
Publication Year :
2018
Publisher :
IEEE, 2018.

Abstract

In this work, which is intended to be a Full Paper in the Innovative Practice Category, the implementation of an improved placement exam that increased the pass rate in a junior level systems course in the author’s electrical engineering department by 15% is presented. For almost 30 years the author’s EE department has used a face to face exam to place students in a junior level circuits and systems course or into a review workshop. The details of the exam and suggestions about future use in conjunction MyOpenMath analytics to increase student success are also given.

Details

Database :
OpenAIRE
Journal :
2018 IEEE Frontiers in Education Conference (FIE)
Accession number :
edsair.doi...........73e12cc596424ade4a9af3d05f78b7a9