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GaN PMIC Opportunities: Characterization of Analog and Digital Building Blocks in a 650V GaN-on-Si Platform
- Source :
- 2020 IEEE Symposium on VLSI Technology.
- Publication Year :
- 2020
- Publisher :
- IEEE, 2020.
-
Abstract
- This paper reports the performance of GaN -based building blocks for monolithic integration. An integrated gate driver, low-voltage analog and synchronous digital circuits are fabricated in a 650-V GaN-on-Si process and measured. Calibrated GaN models are compared against simulated silicon designs to identify optimal integration criteria.
Details
- Database :
- OpenAIRE
- Journal :
- 2020 IEEE Symposium on VLSI Technology
- Accession number :
- edsair.doi...........73ebd64c8b008598c9e8020b4d181fdd