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EqualWrites: Reducing Intra-Set Write Variations for Enhancing Lifetime of Non-Volatile Caches
- Source :
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24:103-114
- Publication Year :
- 2016
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2016.
-
Abstract
- Driven by the trends of increasing core-count and bandwidth-wall problem, the size of last level caches has greatly increased, and hence the researchers have explored non-volatile memories (NVMs) that provide high density and consume low-leakage power. Since NVMs have low write endurance and the existing cache management policies are write variation (WV) unaware, effective wear-leveling techniques (WLTs) are required for achieving reasonable cache lifetimes using NVMs. We present EqualWrites, a technique for mitigating intra-set WV. Our technique works by recording the number of writes on a block and changing the cache-block location of a hot data item to redirect the future writes to a cold block to achieve wear leveling. Simulation experiments have been performed using an x86–64 simulator and benchmarks from SPEC06 and high-performance computing field. The results show that for single-, dual-, and quad-core system configurations, EqualWrites improves cache lifetime by $6.31\times $ , $8.74\times $ , and $10.54\times $ , respectively. In addition, its implementation overhead is very small and it provides larger improvement in lifetime than three other intra-set WLTs and a cache replacement policy.
- Subjects :
- 010302 applied physics
Random access memory
Hardware_MEMORYSTRUCTURES
business.industry
Computer science
CPU cache
02 engineering and technology
Parallel computing
01 natural sciences
020202 computer hardware & architecture
Set (abstract data type)
Non-volatile memory
Hardware and Architecture
Embedded system
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
Overhead (computing)
Cache
Electrical and Electronic Engineering
business
Software
Wear leveling
Block (data storage)
Subjects
Details
- ISSN :
- 15579999 and 10638210
- Volume :
- 24
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Accession number :
- edsair.doi...........742357a09f151166efc0ec55954b6124
- Full Text :
- https://doi.org/10.1109/tvlsi.2015.2389113