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A diagnosis scheme for a large-scale system

Authors :
Won Young Lee
Suraj M. Alexander
Source :
Journal of Intelligent Manufacturing. 4:341-354
Publication Year :
1993
Publisher :
Springer Science and Business Media LLC, 1993.

Abstract

This paper presents a method for diagnosis in a large-scale system environment. The method utilizes the theory of hierarchical systems and hybrid diagnostic reasoning from AI (artificial intelligence). In shallow reasoning, which is a part of hybrid reasoning, the concept of entropy is used to determine which component (that might be responsible for a symptom observed) is to be tested next. The procedure is illustrated using a simulated example of a CIM (computer-integrated manufacturing) system, and is implemented on IntelliCorp's knowledge engineering environment (KEE).

Details

ISSN :
15728145 and 09565515
Volume :
4
Database :
OpenAIRE
Journal :
Journal of Intelligent Manufacturing
Accession number :
edsair.doi...........743d9890db8a50fc9c5483ecbdfbf709
Full Text :
https://doi.org/10.1007/bf00123779