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Improvement of Wear Resistance in Laser Shock-Peened Copper Contacts

Authors :
Donghyuck Jung
Changkyoo Park
Eun-Joon Chun
Yoon-Jun Kim
Source :
Korean Journal of Metals and Materials. 58:560-565
Publication Year :
2020
Publisher :
The Korean Institute of Metals and Materials, 2020.

Abstract

This study investigated the influence of laser shock peening without coating (LSPw/oC) on the degradation of copper electrical contacts. A theoretical calculation of the plastic-affected depth (PAD) induced by LSPw/oC was performed, based on the laser-induced plasma pressure along with the Hugoniot elastic limit of our LSPw/oC experimental conditions. The theoretical PAD was obtained approximately 650 μm from the surface for the LSPw/oC at the laser energy density of 5.3 GW/cm2. Various characterization methods such as the Vicker’s hardness test, residual stress test, and electron backscattered diffraction (EBSD) mapping indicated the PAD may play a significant role in laser induced effective depth for LSPw/oC. At a laser energy density of 5.3 GW/cm2, the laser shock-peened copper showed approximately double the surface hardness as compared to the pure copper. This was attributed to grain refinement, which was confirmed by measuring average grain sizes, and by observing mechanical twin structures from the EBSD analysis. Additionally, a compressive residual stress was induced down to the PAD but gradually switched to a tensile residual stress below PAD. The surface hardening effect conferred by LSPw/oC to the pure copper surface resulted in excellent wear resistance, i.e., a low coefficient of friction and wear loss. As a result, the contact exhibited lower electrical resistance following the fretting friction test compared to pure copper; this would result in a significant delay in electrical contact failure. (Received May 25, 2020; Accepted July 01, 2020)

Details

ISSN :
22888241 and 17388228
Volume :
58
Database :
OpenAIRE
Journal :
Korean Journal of Metals and Materials
Accession number :
edsair.doi...........761841e0dd8d49409387c17f64ab3296
Full Text :
https://doi.org/10.3365/kjmm.2020.58.8.560