Erratum: 'A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images' [J. Appl. Phys. 116, 104905 (2014)]

Authors :: Balaji Raghothamachar
Edward K. Sanchez
Dong Su
Lihua Zhang
Mark J. Loboda
Gil Yong Chung
Fangzhen Wu
Eric A. Stach
Michael Dudley
D. M. Hansen
Huanhuan Wang
Stephan G. Mueller
Kim Kisslinger
Source :: Journal of Applied Physics. 116:169901
Publication Year :: 2014
Publisher :: AIP Publishing, 2014.

Subjects :: Materials science
Condensed matter physics
Transmission electron microscopy
Resolution (electron density)
Stacking
General Physics and Astronomy
High-resolution transmission electron microscopy
Fault (power engineering)
Molecular physics

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