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Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications
- Source :
- 2023 IEEE International Reliability Physics Symposium (IRPS).
- Publication Year :
- 2023
- Publisher :
- IEEE, 2023.
Details
- Database :
- OpenAIRE
- Journal :
- 2023 IEEE International Reliability Physics Symposium (IRPS)
- Accession number :
- edsair.doi...........76bdd0d7a11896487089a1c0c9541b16
- Full Text :
- https://doi.org/10.1109/irps48203.2023.10117689