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Single event transient characterization of SiGe HBT by SPA experiment and 3-D process simulation
- Source :
- Science China Technological Sciences. 65:1193-1205
- Publication Year :
- 2022
- Publisher :
- Springer Science and Business Media LLC, 2022.
- Subjects :
- General Engineering
General Materials Science
Subjects
Details
- ISSN :
- 18691900 and 16747321
- Volume :
- 65
- Database :
- OpenAIRE
- Journal :
- Science China Technological Sciences
- Accession number :
- edsair.doi...........78275476e7056020f540da3f14605b5b
- Full Text :
- https://doi.org/10.1007/s11431-021-2013-1