A study on CeO2buffer layer on biaxially textured Ni-3%W substrate deposited by electron beam evaporation with high deposition rate

MLA

B.G. Kwon, et al. “A Study on CeO2buffer Layer on Biaxially Textured Ni-3%W Substrate Deposited by Electron Beam Evaporation with High Deposition Rate.” Progress in Superconductivity and Cryogenics, vol. 13, Mar. 2011, pp. 1–5. EBSCOhost, https://doi.org/10.9714/psac.2011.13.1.001.

APA

B.G. Kwon, Gye-Won Hong, Ho Jin Lee, S.K. Hong, Byeong-Joo Kim, Jong-Beom Lee, Hyungjun Kim, & Hee-Gyoun Lee. (2011). A study on CeO2buffer layer on biaxially textured Ni-3%W substrate deposited by electron beam evaporation with high deposition rate. Progress in Superconductivity and Cryogenics, 13, 1–5. https://doi.org/10.9714/psac.2011.13.1.001

Chicago

B.G. Kwon, Gye-Won Hong, Ho Jin Lee, S.K. Hong, Byeong-Joo Kim, Jong-Beom Lee, Hyungjun Kim, and Hee-Gyoun Lee. 2011. “A Study on CeO2buffer Layer on Biaxially Textured Ni-3%W Substrate Deposited by Electron Beam Evaporation with High Deposition Rate.” Progress in Superconductivity and Cryogenics 13 (March): 1–5. doi:10.9714/psac.2011.13.1.001.