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Direct Imaging of Dopant-Elements Distributions in High-Strength Nanostructured Materials by Atomic-Resolution Z-Contrast STEM

Authors :
E Abe
Source :
Microscopy and Microanalysis. 11
Publication Year :
2005
Publisher :
Oxford University Press (OUP), 2005.

Subjects

Subjects :
Materials science
Dopant
Atomic resolution
business.industry
media_common.quotation_subject
Nanostructured materials
Optoelectronics
Contrast (vision)
Direct imaging
business
Instrumentation
media_common

Details

ISSN :
14358115 and 14319276
Volume :
11
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........7df3f4886abe8a22b1a9829505e6fafa
Full Text :
https://doi.org/10.1017/s1431927605505543
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