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Colored-Grid Background Oriented Schlieren with Double Pass Imaging for Increasing Measurement Sensitivity

Authors :
D. Aoki
M. Ota
Y Ishimoto
S. Udagawa
K. Tajima
Y. Hirose
T. Inage
Source :
Proceedings of the 32nd International Symposium on Shock Waves (ISSW32 2019).
Publication Year :
2019
Publisher :
Research Publishing Services, 2019.

Subjects

Subjects :
Optics
Materials science
Colored
business.industry
Schlieren
Sensitivity (control systems)
business
Grid
Double pass

Details

Database :
OpenAIRE
Journal :
Proceedings of the 32nd International Symposium on Shock Waves (ISSW32 2019)
Accession number :
edsair.doi...........7e4f56ac5ffb7b5886e489e9ca3f38be
Full Text :
https://doi.org/10.3850/978-981-11-2730-4_0425-cd
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