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Transfer Characteristics of CMOS Inverter using 'Steep SS PN-Body Tied SOI-FET'

Authors :
Jiro Ida
Takayuki Mori
Shota Ishiguro
Koichiro Ishibashi
Source :
2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
Publication Year :
2021
Publisher :
IEEE, 2021.

Abstract

We report for the first time the measured transfer characteristics of CMOS inverter using the steep subthreshold slope (SS) PN-Body Tied (PNBT) SOI-FET. When the position of SS of both NMOS and PMOS are overlapped, it shows a surprisingly very steep, ideally right angle, transfer characteristic, compared with the case of the conventional SOI-CMOS. It is an interesting finding when using the real ideally steep SS device, such as PNBT SOI-FET.

Details

Database :
OpenAIRE
Journal :
2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
Accession number :
edsair.doi...........7f6807adfee72ddf5bec7626ce24743c
Full Text :
https://doi.org/10.1109/vlsi-tsa51926.2021.9440072