Critical Current Modulation in Josephson Junctions Contacted by Redundant Vias

We study the impact of redundant via placement on Fraunhofer interference patterns in superconductor-insulator-superconductor Josephson junctions with thin counter electrodes. By varying the number and location of contact vias to the counter electrode in otherwise equivalent junctions and studying the magnetic field dependence of the critical current, we observe a variety of unconventional features in the interference patterns, including a lifting of critical current minima and differences in node positions and side lobe amplitudes. We attribute these features to local changes in the Josephson phase gradient arising from the non-uniform magnetic thickness resulting from the vias. Our findings highlight the significant role that contact vias on thin counter electrodes play in the response of Josephson junctions to applied magnetic fields.