Failures in ultrathin oxides: Stored energy or carrier energy driven?

Authors :: Frederic Monsieur
Gerard Ghibaudo
Emmanuel Vincent
David Roy
Sylvie Bruyere
Source :: Microelectronics Reliability. 41:1367-1372
Publication Year :: 2001
Publisher :: Elsevier BV, 2001.

Subjects :: Materials science
business.industry
Stored energy
Optoelectronics
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Condensed Matter Physics
business
Atomic and Molecular Physics, and Optics
Energy (signal processing)
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials

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