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Effect of Interfaces on the Properties of Polycrystalline Thin-Film PZT Ferroelectric Capacitors

Authors :
A. V. Petrov
Galina Kramar
Petr Afanasjev
I. E. Titkov
D. V. Mashovets
V. P. Afanasjev
I. V. Grekhov
L. A. Delimova
Source :
MRS Proceedings. 966
Publication Year :
2006
Publisher :
Springer Science and Business Media LLC, 2006.

Abstract

A photocurrent directed opposite to ferroelectric (FE) polarization is observed in short-circuit thin-film polycrystalline Pt/PZT/Ir structures. The direction and magnitude of photocurrent are defined by the sign and magnitude of the FE polarization. A model based on a photovoltaic effect with characteristics determined by polarization of PZT grains is proposed. The model considers the field interaction of FE polarization charge with the charge carriers in intergranular PbO channel. Thin-film FE capacitor is considered as a photosensitive heterogeneous medium, where the conduction of PbO channels along PZT grain boundaries is controlled by FE polarization.

Details

ISSN :
19464274 and 02729172
Volume :
966
Database :
OpenAIRE
Journal :
MRS Proceedings
Accession number :
edsair.doi...........80abc8bab7192f3f95061464ad58a748
Full Text :
https://doi.org/10.1557/proc-0966-t13-02