High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses

MLA

Yan He, et al. “High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses.” Microscopy and Microanalysis, vol. 24, Aug. 2018, pp. 30–31. EBSCOhost, https://doi.org/10.1017/s1431927618012576.

APA

Yan He, Yong S. Chu, Zhihua Dong, Meifeng Lin, Evgeny Nazaretski, Hanfei Yan, Xiaojing Huang, Hande Öztürk, Mingyuan Ge, Petr Ilinski, & Ian K. Robinson. (2018). High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses. Microscopy and Microanalysis, 24, 30–31. https://doi.org/10.1017/s1431927618012576

Chicago

Yan He, Yong S. Chu, Zhihua Dong, Meifeng Lin, Evgeny Nazaretski, Hanfei Yan, Xiaojing Huang, et al. 2018. “High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses.” Microscopy and Microanalysis 24 (August): 30–31. doi:10.1017/s1431927618012576.