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A GENERIC VMI MEASUREMENT AND APPLICATION IN THE SEMICONDUCTOR INDUSTRY
- Source :
- 2018 Winter Simulation Conference (WSC).
- Publication Year :
- 2018
- Publisher :
- IEEE, 2018.
Details
- Database :
- OpenAIRE
- Journal :
- 2018 Winter Simulation Conference (WSC)
- Accession number :
- edsair.doi...........832505c285b6e99ea95d1eeb943460a1
- Full Text :
- https://doi.org/10.1109/wsc.2018.8632431