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New photolithography stepping machine

Authors :
J. Klingmann
L. Hale
D. Markle
Publication Year :
1995
Publisher :
Office of Scientific and Technical Information (OSTI), 1995.

Abstract

A joint development project to design a new photolithography steeping machine capable of 150 nanometer overlay accuracy was completed by Ultratech Stepper and the Lawrence Livermore National Laboratory. The principal result of the project is a next-generation product that will strengthen the US position in step-and-repeat photolithography. The significant challenges addressed and solved in the project are the subject of this report. Design methods and new devices that have broader application to precision machine design are presented in greater detail while project specific information serves primarily as background and motivation.

Details

Database :
OpenAIRE
Accession number :
edsair.doi...........83658b85e0f047b01623faa9317cd96e
Full Text :
https://doi.org/10.2172/97300