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Study on Transmission Line Image Defect Recognition Algorithm based on Faster-RCNN

Authors :
Dabing Yang
Chaohua Huang
Hongwu Tan
Source :
2021 2nd International Conference on Electronics, Communications and Information Technology (CECIT).
Publication Year :
2021
Publisher :
IEEE, 2021.

Details

Database :
OpenAIRE
Journal :
2021 2nd International Conference on Electronics, Communications and Information Technology (CECIT)
Accession number :
edsair.doi...........8477e6aa541d93ed5f466d6d61dee1a7
Full Text :
https://doi.org/10.1109/cecit53797.2021.00210
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