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Ordered clustering method and degradation trend analysis for performance degradation of tantalum capacitor

Authors :
Jingying Zhao
Jianmeng Liu
Source :
IEEJ Transactions on Electrical and Electronic Engineering. 15:179-186
Publication Year :
2019
Publisher :
Wiley, 2019.

Details

ISSN :
19314981 and 19314973
Volume :
15
Database :
OpenAIRE
Journal :
IEEJ Transactions on Electrical and Electronic Engineering
Accession number :
edsair.doi...........84c0ec8fb0c6a352a97411fbb01b26d6
Full Text :
https://doi.org/10.1002/tee.23043