Study of the HPM Interference Effect on Integrated Circuit in a TEM Cell

MLA

Rongquan Chen, et al. “Study of the HPM Interference Effect on Integrated Circuit in a TEM Cell.” 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), Aug. 2019. EBSCOhost, https://doi.org/10.1109/qr2mse46217.2019.9021248.

APA

Rongquan Chen, Fang Wenxiao, Chun-Yong Han, Xiangjun Lu, Yun-lei Shi, Wei-Heng Shao, E Shao, Xu Xuecheng, & Hengzhou Liu. (2019). Study of the HPM Interference Effect on Integrated Circuit in a TEM Cell. 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE). https://doi.org/10.1109/qr2mse46217.2019.9021248

Chicago

Rongquan Chen, Fang Wenxiao, Chun-Yong Han, Xiangjun Lu, Yun-lei Shi, Wei-Heng Shao, E Shao, Xu Xuecheng, and Hengzhou Liu. 2019. “Study of the HPM Interference Effect on Integrated Circuit in a TEM Cell.” 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), August. doi:10.1109/qr2mse46217.2019.9021248.