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Mitigating Impact of Defects On Performance with Classical Device Engineering of Scaled Si/SiGe Qubit Arrays

Authors :
R. Kotlyar
S. Premaratne
G. Zheng
J. Corrigan
R. Pillarisetty
S. Neyens
O. Zietz
T. Watson
F. Luthi
F. Borjans
L. Lampert
E. Henry
H. George
S. Bojarski
J. Roberts
A. Y. Matsuura
J. S. Clarke
Source :
2022 International Electron Devices Meeting (IEDM).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........85bf81d80748460d88d6f07eac5d74e2
Full Text :
https://doi.org/10.1109/iedm45625.2022.10019382
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