How Accurately Can the Surface Resistance of Various Superconducting Films Be Measured with the Sapphire Hakki–Coleman Dielectric Resonator Technique?

It has been shown in the past that a random uncertainty in surface resistance measurements of HTS films as low as 1.1% can be achieved. However for comparative studies between differing samples and different laboratories the absolute uncertainty should be used instead. In this paper we discuss random and absolute uncertainties of R S measurements for three types of superconducting thin films, namely YBa2Cu3O7−δ, Tl(Ba,Sr)2Ca2Cu3Oy, and MgB2 when using an optimized Hakki–Coleman dielectric resonator.