Systematic investigation of the growth and structural properties of FeTiO3±δ epitaxial thin films

An understanding of the thin film structure and properties of ilmenite is crucial for the future study of ilmenite-hematite solid solutions for spintronics applications. Here, we report a systematic study of the FeTiO3±δ thin film structure as a function of the deposition parameters during pulsed laser ablation. The films are found to be crystalline and epitaxial on α-Al2O3(0001) substrates for a wide range of substrate temperatures and oxygen pressures. Initial stages of the film growth and in-plane lattice relaxation were investigated. The increase in the a lattice parameter of up to 6% above its bulk value was observed and is most probably due to the buckling of a few ilmenite monolayers at the film/substrate interface because of a significant compressive stress induced on the film by sapphire substrate. In spite of the absence of a diffraction peak corresponding to the ordered R3¯ phase, these films consist of pure ilmenite phase with negligible net magnetization. Film conductivity is tuned over three...