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Towards automated analysis of serial crystallography data at European XFEL
- Source :
- X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI.
- Publication Year :
- 2023
- Publisher :
- SPIE, 2023.
Details
- Database :
- OpenAIRE
- Journal :
- X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI
- Accession number :
- edsair.doi...........889478b7aa80778e59b1b28d2ed75f6e
- Full Text :
- https://doi.org/10.1117/12.2669569