Characterization of CVD Grown Multi-layer Graphene by Microscopic Raman Spectroscopy and Bulk-sensitive XPS

MLA

Mizuhisa Nihei, et al. “Characterization of CVD Grown Multi-Layer Graphene by Microscopic Raman Spectroscopy and Bulk-Sensitive XPS.” Hyomen Kagaku, vol. 30, Jan. 2009, pp. 403–09. EBSCOhost, https://doi.org/10.1380/jsssj.30.403.

APA

Mizuhisa Nihei, Eiji Ikenaga, Haruki Sumi, Akihiko Saikubo, Shuichi Ogawa, Tomihide Takami, & Yuji Takakuwa. (2009). Characterization of CVD Grown Multi-layer Graphene by Microscopic Raman Spectroscopy and Bulk-sensitive XPS. Hyomen Kagaku, 30, 403–409. https://doi.org/10.1380/jsssj.30.403

Chicago

Mizuhisa Nihei, Eiji Ikenaga, Haruki Sumi, Akihiko Saikubo, Shuichi Ogawa, Tomihide Takami, and Yuji Takakuwa. 2009. “Characterization of CVD Grown Multi-Layer Graphene by Microscopic Raman Spectroscopy and Bulk-Sensitive XPS.” Hyomen Kagaku 30 (January): 403–9. doi:10.1380/jsssj.30.403.