Back to Search Start Over

Developing Ni–Al and Ru–Al intermetallic films for use in microelectromechanical systems

Authors :
Suzanne E. Mohney
J. A. Howell
C. L. Muhlstein
Source :
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 29:042002
Publication Year :
2011
Publisher :
American Vacuum Society, 2011.

Abstract

Ordered intermetallic films have a favorable combination of properties such as high strength, metallic electrical conductivity, good oxidation and corrosion resistance, and a high melting temperature and thermal stability that make them suitable for microelectromechanical systems (MEMS). One potential drawback to intermetallics is a lack of ductility at room temperature; however, the B2 compounds NiAl and RuAl show some ductility at room temperature, which has been shown to increase as the grain size decreases. Additionally, the fracture toughness of both materials is higher than those of Si and SiGe. It is also possible to deposit these materials at temperatures that make them compatible with complementary metal oxide semiconductor processing. The authors have shown that by controlling the Ar pressure during cosputtering, NiAl and RuAl thin films can be deposited near room temperature with stresses ranging from compressive to tensile, possibly eliminating the need for annealing. This article examines Ni–...

Details

ISSN :
21662754 and 21662746
Volume :
29
Database :
OpenAIRE
Journal :
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Accession number :
edsair.doi...........8b11ef7ee6a68dd0a9504b4561b0a3f9
Full Text :
https://doi.org/10.1116/1.3607314