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Comparative determinations of the /spl chi//sup (2)/ spatial distribution induced in thermally poled silica planar samples
- Source :
- IEEE Photonics Technology Letters. 18:1049-1051
- Publication Year :
- 2006
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2006.
-
Abstract
- We herein report the comparison of two independent reconstructions of the distribution of the /spl chi//sup (2)/ nonlinear susceptibility induced by thermal poling in planar silica samples. Both nonlinear profiles are quantitatively in good agreement in terms of /spl chi//sup (2)/ magnitude and nonlinear thickness; and qualitatively in agreement in terms of shape. We conclude that both characterization methods used are efficient for the determination of the /spl chi//sup (2)/ susceptibility spatial distribution in bulk samples.
- Subjects :
- Materials science
business.industry
Poling
Analytical chemistry
Computer Science::Software Engineering
Nonlinear optics
Spatial distribution
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
Planar
Optics
Characterization methods
Bulk samples
Integrated optics
Electrical and Electronic Engineering
business
Subjects
Details
- ISSN :
- 10411135
- Volume :
- 18
- Database :
- OpenAIRE
- Journal :
- IEEE Photonics Technology Letters
- Accession number :
- edsair.doi...........8c49886d3b54e759ed7b1a347f040759